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NIST Improves Microscope's Stability for Nanomanufacturing Biology

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Ian an atomic force microscope (AFM), force is measured by a laser beam, yellow in this artist's rendition. AFM photo.

Photo: G. Kuebler/JILA/CU

A research team from the Department of Commerce’s National Institute of Standards and Technology (NIST) and the University of Colorado has improved by 100 times the stability of a workhorse tool in nanotechnology, known as the atomic force microscope, potentially improving a wide range of areas from nanomanufacturing to biology, where sensitive, atom-scale measurements must be made at room temperature in liquids. (More)

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